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Industry News

Third generation semiconductor materials: silicon carbide and gallium nitride

Third generation semiconductor materials: silicon carbide and gallium nitride

2025-01-07

Among the many wide-band gap materials, gallium nitride (GaN) and silicon carbide (SiC) are particularly prominent, which not only show great potential in switching applications, but also show bright prospects in the field of RF power.

 
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Wafer level bonding mechanism construction and core technology

Wafer level bonding mechanism construction and core technology

2025-01-08

Wafer-Level bonding for the vast majority of semiconductor practitioners should have less contact, after all, advanced packaging has just begun in recent years, and the process process of advanced packaging is wafer-bongding.

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Detailed wafer testing (WAT)

Detailed wafer testing (WAT)

2025-01-07

With the rapid development of semiconductor technology, Wafer Acceptance Test (WAT) has become increasingly prominent in the semiconductor manufacturing process. The core goal of WAT testing is to ensure that the electrical characteristics and process parameters of wafers meet design standards before packaging and cutting, thereby improving product yield and reliability.

 
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Excellent properties of high thermal conductivity aluminum nitride ceramic materials

Excellent properties of high thermal conductivity aluminum nitride ceramic materials

2025-01-06

With the rapid development of modern science and technology, material science, as one of the basic disciplines, has attracted increasing attention. High thermal conductivity aluminum nitride (AlN) ceramic material has gradually become an important material in electronics, optoelectronics, aerospace and other fields because of its excellent thermal conductivity and unique physical and chemical properties.

 
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Semiconductor inspection technology - Summary of the difficulties and detection algorithms of bare wafer crack detection technology

Semiconductor inspection technology - Summary of the difficulties and detection algorithms of bare wafer crack detection technology

2025-01-05

As wafer sizes increase and become thinner and larger, the demand for higher accuracy and yield continues to increase. Mechanical stress in wafers during handling, cutting, or heat treatment may cause cracks. Cracks can also lead to reduced production and reliability failures. Therefore, one of the most critical problems in semiconductor packaging process is cracking.

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Structural research and technology of semiconductor -Thermo Chuck (Temperature Chuck)

Structural research and technology of semiconductor -Thermo Chuck (Temperature Chuck)

2025-01-04

Wafer hot chucks are often used for wafer temperature testing. There are also other applications

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Major equipment and material inventory in semiconductor manufacturing process

Major equipment and material inventory in semiconductor manufacturing process

2025-01-02

The processing process of semiconductor products mainly includes wafer manufacturing (Front, Front End) and packaging (Back, Back End) testing, with the penetration of advanced packaging technology, there is a processing link between wafer manufacturing and packaging, known as the Middle (Middle End).

 
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Semiconductor manufacturing process

Semiconductor manufacturing process

2024-12-29

The wafer processing process mainly involves the fabrication of circuits and electronic components (such as transistors, capacitors, logic gates, etc.) on silicon wafers, which is the most complex and costly process among the aforementioned processes

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Wafer manufacturing process flow

Wafer manufacturing process flow

2024-12-28

Wafer manufacturing process flow

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